Resistive Switching like-behaviour in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications

A. Crespo-Yepes, J. Martín-Martínez, R. Rodríguez, M. Nafría and X. Aymerich
Resistive Switching like-behaviour in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications
Microelectronics Reliability, Volume 53, Issues 9–11, pp. 1247-1251 (2013)

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Temperature dependence of the Resistive Switching-related currents in ultra-thin high-k based MOSFETs

A. Crespo-Yepes, J. Martin-Martinez, R. Rodriguez, M. Nafria, and X. Aymerich,
Temperature dependence of the Resistive Switching-related currents in ultra-thin high-k based MOSFETs
Journal of Vacuum Science and Technology B, Vol. 31(2), pp. 022203-022203-5 (2013).

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