Resistive Switching like-behaviour in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications

A. Crespo-Yepes, J. Martín-Martínez, R. Rodríguez, M. Nafría and X. Aymerich
Resistive Switching like-behaviour in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications
Microelectronics Reliability, Volume 53, Issues 9–11, pp. 1247-1251 (2013)