Multi-scale quantum point contact model for filamentary conduction in resistive random access memories devices

Lian, Xiaojuan; Cartoixà, Xavier; Miranda, Enrique; Perniola, Luca; Rurali, Riccardo; Long, Shibing; Liu, Ming and Suñé, Jordi
Multi-scale quantum point contact model for filamentary conduction in resistive random access memories devices
Journal of Appl. Phys. 115 (24), 244507 (2014)