A new high resolution Random Telegraph Noise (RTN) characterization method for Resistive RAM

M. Maestro, J. Diaz, A. Crespo-Yepes, M. B. Gonzalez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. Campabadal and X. Aymerich
A new high resolution Random Telegraph Noise (RTN) characterization method for Resistive RAM 
Solid State Electronics, Vol. 115, pp. 140-145 (2016)