Dielectric Breakdown Processes (Invited Book Chapter) Resistive Switching: From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications,

J. Suñé, N. Raghavan and K.L. Pey
Dielectric Breakdown Processes (Invited Book Chapter)
Resistive Switching: From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications,
Wiley, 2016, Online ISBN: 9783527680870
Invited Book Chapter

https://onlinelibrary.wiley.com/doi/abs/10.1002/9783527680870.ch8