Characterization of the Failure Site Distribution in MIM Devices Using Zoomed Wavelet Analysis

J Muñoz-Gorriz, S Monaghan, K Cherkaoui, J Suñé, PK Hurley, E Miranda
Characterization of the Failure Site Distribution in MIM Devices Using Zoomed Wavelet Analysis
Journal of Electronic Materials 47 (9), 5033-5038, 2018

https://link.springer.com/article/10.1007/s11664-018-6298-2