Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages

M. Maestro, J. Martin-Martinez, J. Diaz, A. Crespo-Yepes, M. B. Gonzalez, R. Rodriguez , F. Campabadal , M. Nafria ,  X. Aymerich
Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages
Microelectronic Engineering, Vol. 147, pp.176–179 (2015)

https://ddd.uab.cat/pub/artpub/2015/133466/miceng_a2015m11v147p176.pdf