Advanced Measurement Techniques for the Characterization of Reram Devices

M. Nafria, R. Rodriguez, M. Porti, J. Martin-Martinez, A.Crespo-Yepes, S. Claramunt, X. Aymerich
Advanced Measurement Techniques for the Characterization of Reram Devices
ECS Trans., INVITED PAPER, ECS Trans. Vol. 79(1), pp. 139-148 (2017)

http://ecst.ecsdl.org/content/79/1/139.abstract