Advanced device characterization techniques (Invited Book Chapter) Nano-scaled semiconductor devices: physics, modelling, characterization and social impact

Gutiérrez-D., Stewart E. Rauch, J. Molina, and E. Miranda
Advanced device characterization techniques (Invited Book Chapter)
Nano-scaled semiconductor devices: physics, modelling, characterization and social impact
The Institution of Engineering and Technology (IET), 2016, ISBN: 978-1-84919-930-8
Invited Book Chapter

http://digital-library.theiet.org/content/books/cs/pbcs027e