A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory

A Rodriguez-Fernandez, J Muñoz-Gorriz, J Suñé, E Miranda
A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory
Microelectronics Reliability 88, 142-146, 2018

https://www.sciencedirect.com/science/article/pii/S0026271418305754