Dr. Mireia Bargalló González

Researcher
Institut de Microelectrònica de Barcelona (IMB-CNM)
Consejo Superior de Investigaciones Científicas (CSIC)

Mireia Bargalló González graduated in Physics at the University of Barcelona and she received the Ph.D. degree on the topic of stress analysis and defect characterization techniques of semiconductor materials and devices, from the Katholieke Universiteit Leuven, Belgium in 2011. She pursued her Ph.D thesis with the Epitaxy Group of the Interuniversity Microelectronics Center (imec), Leuven, Belgium.

In 2011, she started as a Postdoctoral Fellow in the Advanced Thin Dielectric Films (ATDF) group of the Institut de Microelectrònica de Barcelona (IMB-CNM, CSIC). In September 2015, she was contracted by her own research Project VARERAM in the framework of Proyectos de Jóvenes Investigadores 2014. This project focuses on the fabrication, advanced characterization and modeling of Memristor devices. Derived from her work, she has published 60 SJR-JCR journal publications and has contributed to more than 120 international conferences.

http://orcid.org/0000-0001-6792-4556  
Author ID: 24921550700
ResearcherID: J-6924-2014


+ Contact

Institut de Microelectrònica de Barcelona (IMB-CNM)
Campus de Bellaterra
E-mail: mireia.bargallo.gonzalez [at] csic [dot] es
tel: +34 93.594.77.00 ext. 2407
fax: +34 93.580.14.96

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